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Imec EU Pilot line NV

Imec EU Pilot line NV is the name TED publishes on 100 notices Belgian notices in this archive. The city published most often is Heverlee.

Published city
Heverlee
Notices
100

Contracts still open

No notice in this archive has a deadline that is still ahead.

Recent notices

100 other notices. The 20 most recent are shown.

  1. FEOL CLEAN CLUSTER
    Publication
  2. Digitale tester setup lot 2
    Publication
  3. FEOL PEALD PLATFORM
    Publication
  4. MASS METROLOGY TOOL
    Publication
  5. MICRO SCALE SHEET RESISTANCE PROBER
    Publication
  6. EUV TRACK (HNA/LNA)
    Publication
  7. Automated TEM Analysis Platform
    Publication
  8. TDV ETCH
    Publication
  9. Automatic Capillary Underfill Dispense System
    Publication
  10. LOGIC FEOL DRY ETCH CHAMBER
    Publication
  11. IR LASER DEBONDER
    Publication
  12. Single Wafer ALD Tool
    Publication
  13. Single Wafer ALD Tool
    Publication
  14. Backside Cleaning Tool
    Publication
  15. 300MM VOLLEDIG GEAUTOMATISEERDE LAMINATOR
    Publication
  16. Raamovereenkomst voor ontwerp, bouw en inrichting van een cleanroom
    Publication
  17. Single Wafer ALD Tool
    Publication
  18. Edge Condition System
    Publication
  19. Digital tester setup
    Publication
  20. Digital tester setup
    Publication

Awards

38 published awards. The 15 most recent are shown.

  1. MASS METROLOGY TOOL
    Winner
    Lam Research International Sdn. Bhd.
    Publication
  2. MICRO SCALE SHEET RESISTANCE PROBER
    Winner
    KLA Corporation
    Publication
  3. EUV TRACK (HNA/LNA)
    Winner
    Tokyo Electron Europe Limited
    Publication
  4. Automated TEM Analysis Platform
    Winner
    FEI EUROPE BV
    Publication
  5. TDV ETCH
    Winner
    Tokyo Electron Limited
    Publication
  6. Automatic Capillary Underfill Dispense System
    Winner
    MUSASHI ENGINEERING, INC.
    Publication
  7. IR LASER DEBONDER
    Winner
    EV Group Europe & Asia/Pacific GmbH
    Publication
  8. Raamovereenkomst voor ontwerp, bouw en inrichting van een cleanroom
    Winner
    Drees & Sommer SE
    Publication
  9. FEOL ETCH CLUSTER
    Winner
    Tokyo Electron Europe Limited
    Publication
  10. Dry Etch Isotropisch Etch Platform
    Winner
    Tokyo Electron Europe Limited
    Publication
  11. Bevel Treatment Platform
    Winner
    Lam Research International Sdn. Bhd.
    Publication
  12. Advanced Lithography EUV Scanner
    Winner
    ASML NL
    Publication
  13. toestel voor de deponering van dikke oxide-diëlectrica
    Winner
    LAM
    Publication
  14. DEPOSITIE CLUSTER TOOLS
    Winner
    LAM
    Publication
  15. Virtual Compute Platform
    Winner
    ASML
    Publication

All buyers